Dedicated to characterization of natural and experimental samples from the different laboratory teams, the analytical platform is composed of a scanning electron microscope, a Raman microspectrometer, an X-Ray diffractometer and a magnetic characterization equipment.
Scanning electron microscope
Scanning electron microscope (SEM-FEG) ZEISS Zigma Detectors: ASB, SE2, Inlens, EDS and EBSDOxford Instruments camera
Based on electron-matter interactions, the electron microscope is capable of providing high-resolution images of the samples surface at considerable magnifications (X250000) and characterizing phases with micrometric accuracy.
Spot analyzes EDS (energy dispersive spectroscopy) and EBSD (diffraction of backscattered electrons)
Making images with different contrasts: chemical, topographic, elementary (X mapping) and crystallographic (diffraction of backscattered electrons)
Raman microspectrometer
Raman microspectrometer Renishaw InVia
A method of vibrational spectroscopy based on the inelastic diffusion of light, it allows the characterization of crystalline phases but also of uncrystallized phases such as glasses, liquids, gases and organic materials (carbonisats…).
Non-destructive technique
Needing little or no preparation
Analysis resolution of the micrometer order
Large-scale Raman mapping (Stream-Line)
Two incident wavelengths available (514 and 785 nm)
Tool of choice in the study of carbon materials
Diffractomètre à rayon X
X-Ray diffractometer Rigaku XMAX 2500 with rotating anode
The X-ray diffractometer allows characterization of the crystallized phases through the diffraction of X-rays by the matter interatomic planes.
Rotating anode
Intensity max 300 mA and Tension max 60 KV
Magnetic characterization of rocks and minerals
Magnetic characterization of rocks and minerals
A strong field magnet coil
An equipment to measure anisotropy and magnetic susceptibility in KLY-3 heaters (Agico)
