Scanning electron microscope
- Spot analyzes EDS (energy dispersive spectroscopy) and EBSD (diffraction of backscattered electrons)
- Making images with different contrasts: chemical, topographic, elementary (X mapping) and crystallographic (diffraction of backscattered electrons)
Scanning electron microscope (SEM-FEG) ZEISS Zigma
Detectors: ASB, SE2, Inlens, EDS and EBSD Oxford Instruments camera
Based on electron-matter interactions, the electron microscope is capable of providing high-resolution images of the samples surface at considerable magnifications (X250000) and characterizing phases with micrometric accuracy.
Raman microspectrometer
- Non-destructive technique
- Needing little or no preparation
- Analysis resolution of the micrometer order
- Large-scale Raman mapping (Stream-Line)
- Two incident wavelengths available (514 and 785 nm)
- Tool of choice in the study of carbon materials
Raman microspectrometer Renishaw InVia
A method of vibrational spectroscopy based on the inelastic diffusion of light, it allows the characterization of crystalline phases but also of uncrystallized phases such as glasses, liquids, gases and organic materials (carbonisats…).